Can one delay corner be reused across several different modes?
From PDVerse MMMC Interview Masterclass · pdVerse Mentor Series
Direct answer
Yes. A delay corner only describes a cell-plus-wire physical condition — it has no idea what behavior the chip is performing. So the same delay corner can legitimately pair with a functional constraint mode, a scan constraint mode, or a low-power constraint mode to build separate views.
Mentor explanation
This is the mirror image of reusing a constraint mode across corners. If your "worst-case slow" delay corner is a valid physical condition, it's just as valid whether the chip happens to be running functionally or shifting scan data in that condition. Reuse here keeps your physical assumptions consistent everywhere they apply, and it avoids quietly duplicating (and potentially drifting) the same library-set-plus-RC-corner definition under five different names.
Key takeaways
- Yes.
- A delay corner only describes a cell-plus-wire physical condition — it has no idea what behavior the chip is performing.
Self-check: can you answer this aloud?
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- State the direct answer.
- Explain the timing or physical reason.
- Name one caveat.
- Say how you would verify it in a real flow.
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