BeginnerQuestion 163 of 187Source: Synopsys IC Validator User Guide: IC Validator Basics

How can a design pass LVS but fail ERC?

From PDVerse PnR Interview Handbook ¡ pdVerse Mentor Guide

Short Answer

LVS only asks whether the layout matches the reference netlist. If the reference itself contains an electrical hazard, such as an unused gate input left unconnected, the layout faithfully reproduces it and LVS passes. ERC checks the extracted circuit for hazards like floating gates, so it fails on exactly the case LVS cannot see.

Technical Reference DiagramHow can a design pass LVS but fail ERC?
Schematic of an inverter whose input is left unconnected, with the floating gate marked in red, shown identically in the reference netlist and the extracted layout netlist so that LVS matches while ERC flags the floating input.

Technical Explanation

  • A floating gate has no driver and no tie to a supply. Its voltage drifts with leakage and coupling, often settling near the switching threshold. At that point both the pull-up and pull-down transistors of the next stage are partly on, and current flows straight from VDD to VSS.
  • If the RTL or netlist leaves a spare-cell input or an unused mux input unconnected, and the layout also leaves it unconnected, both netlists agree. The compare() (ICV) result is PASS because there is nothing to mismatch.
  • ERC does not compare. It walks the extracted connectivity and applies electrical rules from the runset, such as "every gate must connect to a driver or a supply" and "every well must be tied". A floating input fails that rule directly.
  • The effect in silicon is leakage and noise. One floating input may add microamps; a spare-cell array with hundreds of floating inputs can move standby current enough to fail a low-power specification, and a floating input on a live path can cause random logic values.
  • Other pass-LVS, fail-ERC cases include wells or substrate regions without a tap connection and gates tied directly to a supply rail where the foundry requires a tie-high or tie-low cell for protection. The netlist may express the tie the same way in both views, so LVS is happy.
  • ERC is not a separate tool. The IC Validator guide lists ERC alongside DRC and LVS as checks a runset can contain, and the foundry decides which electrical rules are included and whether they run with the LVS extraction or in their own deck. Read the foundry runset notes to know which ERC checks your signoff actually covers.
  • The usual fix is in the netlist, not the layout: tie unused inputs through tie cells, then rerun LVS and ERC. Changing only the layout would make LVS fail, because the reference would still show the input unconnected.

Common Mistake

The Trap: Seeing ERC floating-gate flags on spare cells and waiving them as "spare, not used". The spare cells are powered, their inputs float mid-rail, and each one draws crowbar current. Across 900 spare cells the standby current rises by several hundred microamps, and the part misses its leakage limit on first silicon. Tying the inputs through tie cells in the netlist would have taken one ECO. Instead the fix waits for a metal-layer respin, and the first batch of parts is sold only into applications that tolerate the higher standby current.

Follow-up Question & Model Response

"Why does fixing the floating input usually need a netlist change rather than a layout-only change?"

Candidate Model Response: LVS compares the layout with the reference netlist. If I just draw a connection from the floating input to a tie cell in the layout, the reference still shows the input unconnected, so LVS now fails on an extra connection. The correct fix is an ECO in the netlist that connects the input to a tie-high or tie-low cell, then the matching layout change. After that both LVS and ERC pass on the same data.

Practical Example

Tapeout Scenario: A block has 120 spare cells, and 96 of their inputs are left unconnected in the netlist (illustrative). LVS returns LVS Compare Results: PASS (ICV) because the layout matches. The ERC part of the run flags 96 floating gates. An ECO adds 12 tie-low cells, each fanning out to 8 inputs, and updates both netlist and layout. The next run shows LVS PASS and 0 floating-gate flags, and simulated standby current for the block drops by about 40 ÂľA. The same spare cells had been flagged in the previous project and waived; this time the ERC report was treated as a netlist bug instead.

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